JPH0459148U - - Google Patents

Info

Publication number
JPH0459148U
JPH0459148U JP10299690U JP10299690U JPH0459148U JP H0459148 U JPH0459148 U JP H0459148U JP 10299690 U JP10299690 U JP 10299690U JP 10299690 U JP10299690 U JP 10299690U JP H0459148 U JPH0459148 U JP H0459148U
Authority
JP
Japan
Prior art keywords
insulating substrate
protrusion
under test
chip under
semiconductor chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10299690U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10299690U priority Critical patent/JPH0459148U/ja
Publication of JPH0459148U publication Critical patent/JPH0459148U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP10299690U 1990-09-27 1990-09-27 Pending JPH0459148U (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10299690U JPH0459148U (en]) 1990-09-27 1990-09-27

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10299690U JPH0459148U (en]) 1990-09-27 1990-09-27

Publications (1)

Publication Number Publication Date
JPH0459148U true JPH0459148U (en]) 1992-05-21

Family

ID=31847702

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10299690U Pending JPH0459148U (en]) 1990-09-27 1990-09-27

Country Status (1)

Country Link
JP (1) JPH0459148U (en])

Similar Documents

Publication Publication Date Title
KR930022510A (ko) 테스트 접촉부만을 가지는 반도체 장치 제조 방법
US5053850A (en) Bonding pad for semiconductor devices
JPS55133549A (en) Probe card
JPH0459148U (en])
JPS5688343A (en) Multichip type semiconductor package
JPH0623248U (ja) 半導体装置
JPS6041728Y2 (ja) 半導体装置
JPH09199555A (ja) 半導体装置及びその試験方法
JPH0355982B2 (en])
JPS63152243U (en])
JPH0327047U (en])
JPS62157146U (en])
JPS5911449U (ja) 半導体装置
JPS6398633U (en])
JPS61125054A (ja) 半導体装置
JPH044754U (en])
JPS6416636U (en])
JPS5868036U (ja) 半導体集積回路測定装置
JPS62170543U (en])
JPS6045442U (ja) リ−ドレスチツプキヤリア
JPH0234953A (ja) 特性チェックパッドを備えた半導体装置
JPS62157145U (en])
JPS63145343U (en])
JPH0270441U (en])
JPH03106684U (en])